Dr. Hans U. Danzebrink obtained his Dipl.-Ing. degree for electrical engineering from the Technical University of Braunschweig. In 1991 he joined the Physikalisch-Technische Bundesanstalt (PTB) and received his PhD degree in electrical engineering on a development of new high-resolution microscopy methods in 1996 from the Technical University of Braunschweig. Currently he is head of the working group for “Scanning Probe Metrology” in the department of “Dimensional Nanometrology”.
Since more than 18 years he is involved in dimensional nano- and micrometrology. His fields of work span from the development of compact scanning probe heads, metrological scanning probe systems to novel interferometric position sensors.