Call for Papers Metromeet 2014 - Send your paper before 30/09/2013
METROMEET has already started the preparation of its 10th edition, and invites experts and researchers on Industrial Dimensional Metrology to share their knowledge and experiences.
METROMEET has consolidated as an international reference in the area of Industrial Dimensional Metrology, so it summons international leaders of the sector, to expose the latest advances in the subject and to propose product quality improvements and production efficiency.
During METROMEET, we will present the latest advances in state-of-the-art technologies and the improvements of the sector; and will constitute a forum to debate about Metrology and its development in an industry that changes rapidly. Among other interesting topics, we will talk about new digital and optical developments, the new European and international rules and methods to improve industrial processes and productivity.
Share your knowledge! Click here to get more information.
Thank you all for your participation!
Metromeet has finished the 9th edition of the Conference. The organization is very happy with the result; we did see a fantastic presentations and would like to thank the speakers for their effort. We are happy as well with the interaction of the attendees, this year we noticed a high level of participation of the audience. More than 110 people have visited the Euskalduna Palace of Bilbao (Spain), to attend to the two tutorials, three keynotes and 18 presentations of the Programme.
The closing video of the Conference is already available, and also are the photos of the event. We hope we’ll see you all at the 10th edition of Metromeet, that will be held on 27th and 28th March in Bilbao.
Last days to register in Metromeet
Metromeet will open its doors this week, and you have time enough to register! Don't miss the 9th edition of this unique Conference, where you will be able to establish professional contacts with delegates of the most important companies of the industry, and discover the best techniques to save time and cost in your measurement processes. Register today!
Discover our Keynotes!
We are proud of presenting Clivia Sotomayor and Luigi Semeraro as keynote speakers of Metromeet. Clivia Sotomayor will give a presentation about nanometrology for self-assembly nanofabrication methods, in which she will explain the latest advances of of the Catalan Institute of Nanotechnology (ICN). She will introduce two methods, suitable for the characterisation of ordered self-assembled block co-polymers in both one- and two- dimensions and she will present emerging methods based on acoustic phonons for sub-5 nm dimensional.
In the other hand, Luigi Semeraro leads the metrology group looking after all the metrology tasks related to the European in kind contribution to the ITER and Broader approach international nuclear fusion projects. The presentation will outline the main objectives of F4E and F4E metrology team, and the strategy adopted to coordinate manufacturing processes from the acceptance and assemblability points of view.
Register today and enjoy the special early bird discount!
Metromeet 2013 Programme - First names!
The Technical Commmittee has finished the evaluation of the papers received and started the configuration of the Programme. Visit our website to be up to date with all the news.
Metromeet will have two tutorials, 18 presentations and 3 keynotes, given by professionals of Industrial Dimensional Metrology. Don't wait and register before 31/12/2012 and you will get 20% special discount!
Thomas Campbell, best speaker award
Every year the Technical Committee of Metromeet rewards a speaker for an outstanding presentation. This year it was a tough competition because of the high quality of several speakers. Finally the Technical Committee of Metromeet gave the Best Speaker Award to Thomas Campbell (ICTAS, USA), for his presentation "Metrology for Additive Manufacturing Opportunities in a Rapidly Emerging Technology". The Technical Committee remarked the high quality of his presentation and the real applicability.