Programa
El programa de Metromeet 2013 está todavía en desarrollo.
Nanometrology for self-assembly nanofabrication methods Prof. Dr. Clivia Sotomayor - Catalan Institute of Nanotechnology
Metrology at F4E ( fusion For Energy) Dr. Luigi Semeraro - Fusion for Energy
Metrological software: from testing to certification Begoña Laibarra - SQS
Information management standards for digital metrology: from data to knowledge Toni Ventura-Traveset - Datapixel
Statistical data processing in coordinate metrology: standards, approaches and realization Maryna Galovska - Institut für Produktionsmesstechnik, TU Braunschweig
In Process Metrology on Large and Multi Axes Machining Centers Ray Karadayi - Applied Automation Technologies, Inc. 
3D Metrology Process Control with High-Speed Helix Computed Tomography Jens Lübbehüsen - GE - Measurement & Control
Advanced semiconductor manufacturing metrology : status and challenges Philippe Maillot - STMicroelectronics
Design and validation of a virtual prototype, using structuredlight simulation software Bart Ribbens - Artesis University College Antwerp
Fibrescopic Micro Fringe Projection Dipl.-Ing.(FH) Christoph Ohrt - Institute of Measurement- und Automatic Control
Scalable Automation for emerging Lab Production Pere Pont - Datapixel
Traceable Nano Indenters Dr. Bartosz Nowakowski - NIST
State-of-the-art physical and chemical characterization for the nanoelectronic industry Narciso Gambacorti - Commissariat à l’énergie atomique et aux énergies alternatives
Dimensional nanometrology at PTB Dr. Hans Danzebrink - PTB
Performance evaluation of 3D imaging systems based on GD&T Benjamin Carrier - National Research Council of Canada
Approaches & Standars for Metrology Software Information Interoperability within Factory Information Systems Dr. Oscar Lázaro - Asociación Innovalia
Metrology Throughout the Organisation Michael Stones - Delcam
3D Experience industry solutions for optimizing the manufacturing process Daniel Pyzak - Dassault Systèmes
Knowledge-based optimisation by extensive control and data acquisition in milling Dipl.-Ing. Reik Krappig - Fraunhofer-Institut für Produktionstechnologie IPT
Numerical compensation of volumetric error positioning on large machine tools Aitor Olarra - Tekniker
Periodic verification of three-coordinate measuring machines based on ISO 10360 Felipe Pereda - Unimetrik
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