Programa
Estamos trabajando en el programa para la edición de Metromeet 2012. Visite regularmente esta página para conocer las novedades en el programa.
How accurate are Computed Tomography dimensional measurements? Simone Carmignato - University of Padova
3D Machine Vision – An Overview Gabriele Jansen - Vision Ventures GMBH & CO. KG
Nanotechnology Roadmap Michael Meador Ph.D - NASA
Metrology for Additive Manufacturing Opportunities in a Rapidly Emerging Technology Thomas Campbell, Ph.D. - (ICTAS), Virginia Tech
The digital metrology workflow, a new paradigm for the knowledge based manufacturing Antonio Ventura - Traveset - Innovalia Metrology
Nano-metrology; Accuracy of interferometric measurements Dr. Han Haitjema - Mitutoyo
3D and metrology in an unusual and very challenging environment: the In Vessel Viewing System (IVVS) of ITER Ignazio Piacentini - Imaging Lab
A new Concept for High-Speed atline and inlineCT for up to 100% Mass Production Process Control Jens Lübbehüsen - GE
Intelligent Camshaft Manufacturing Systems. Dimensional Quality Control in the Factory Line Iñigo Perez - Engine Power Components
Metrological solutions for diffractive optics manufacturing Pere Pont - Datapixel
Advanced point cloud information management for inline quality control Dr. Oscar Lazaro - Asociacion Innovalia
Metrology in Micro System Technologies Dr. Reiner Götzen - microTEC Gesellschaft für Mikrotechnologie mbH
Minimising the cost of measurement in manufacturing Nick Orchard - Rolls-Royce plc
A two-dimensional moving platform with nanometer resolution to increase the measuring range of AFMs José A. Yagüe-Fabra PhD. - Universidad de Zaragoza
3D capability for nanopositioning and nanometrology Dr. Ing. Denis Dontsov - SIOS Messtechnic GmbH
Magneto-Optical Measurement techniques for Magnetic Materials Metrology Dr. Andreas Berger - CIC nanoGUNE
Measurement uncertainty associated with coordinate measurements: evaluation and reduction Maryna Galovska - (IPROM), Technische Universität Braunschweig
Large Machine tool 5 DOF Verification Aitor Olarra - IK4 – Tekniker
The future of Metrological Software Eva Alonso / Julen Maneros - CBT
Using measurement and software to optimise part setup for machining Philip Hewitt - DELCAM PLC
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