Consolidated as an international reference in the Industrial Dimensional Metrology area, Metromeet 2016 calls the most expert international leaders of the sector to expose their latest advances in the subject during the 22th, 23th and 24th of October in Bilbao.
Metromeet provides an excellent opportunity to be recognized as a reference within the dimensional industry metrology field; direct contact with executives and directors of international leader companies in the metrological sector and also to establish new customers, expand your business and build new relationships.
Types of papers and key topics
The conference offers three different speech formats: Tutorials or two-hour sessions where the speaker can offer his perspective on technologies and tools, 50 minute keynotes or master classes, and finally 25 minute sessions focused on a specific Industrial Dimensional Metrology topic. The list of topics can be found below.
Quality control, metrology solutions for industry, calibration and verification, additive Manufacturing, advances of micro- and nanometrology, future metrology tendencies and latest developments and solutions in the area of optical non-contact measurement and 3D digitalisation systems are some of the topics. “As could be seen during the last three-day of the conferences, the participation of professionals from all fields of the industry has helped to make Metromeet a meeting point for speakers, sponsors and attendees”, explains de la Maza.
For further information, please visit Metromeet call for papers.