The 13th edition of Metromeet constitutes an international discussion forum on the QIF standard.

Last Friday, March 24th, Metromeet came to its end after 3 days of speeches and networking. The international Conference ended with the constitution of a forum that will allow important representatives of the Industry to share developments and ideas about the QiF standard.

Innovalia, thanks to this 13th edition of Metromeet was able to concentrate the main executives of the companies with the greatest international projection such as Metrosage, Capvidia, PwC, Innovalia Metrology, Novo Nordisk A / S, Renishaw and Autodesk among others. Metromeet has once again become the most applauded industrial conference of the year, bringing together representatives from different international universities and other technology centers such as IAC, Fraunhofer IPT, IK4-Tekniker and the German PTB. Sponsored by Innovalia, Renishaw, Faro and Zeiss, this 13th edition of Metromeet had innovative content of great interest and allowed us to discover and debate about the importance of metrology on the path to Industry 4.0

The inauguration of the Conference took place in one of the main rooms of the Euskalduna Palace, where Maurizio Ercole and Toni Ventura shared the Metromeet guidelines and the goals of the meeting.

During his speech, Toni Ventura shared with the audience his perception and the potential of this day. “During my professional career, I have been fortunate to attend numerous Conferences, but Metromeet offers us the perspective of manufacturers, users and researchers in the same environment” commented the charismatic Ventura. Maurizio Ercole, Metromeet’s official Chairman and father of the CMMs, shared with the audience his vision of the importance of metrology in the current panorama.

Metromeets’s organization also offered  a leissure space where sponsors, speakers, exhibitors and assistants shared developments and trajectories. Sponsored by Watify, an European Commission initiative, in this space Metromeet offered  a brief presentation by the CDTI (Center for Industrial Technological Development), providing details on international opportunities for the realization of Advanced manufacturing projects.

One of the most anticipated speakers, Daniel Campbell (Texas, USA), gave the audience the opportunity to discover the challenges, applications and influence of the QiF (Quality Information Framework) standard in the future of Industry 4.0. Daniel’s Tutorial became a reference point in Metromeet 2017, establishing guidelines for constant dialogue with attendees. Attendees and speakers highlighted the theme as an object of interest and lay the basis for continuing the debate and development, not only in the next Metromeet, but in round tables that the organization will prepare throughout the year.

After putting on the table such attractive topics as hybrid measurement, QIF, inspection for additive manufacturing, software solutions for 3D printing and the future of Big Data in Industry 4.0, Metromeet ended the first day of the Conference introducing the topics of the second day of Conference: “Metrological requirements of the Institute of Astrophysics of the Canary Islands” “Metrology 4.0 for Industry 4.0” and a real-time demonstration of M3 Software, the Multisensor Metrology Software of Innovalia Metrology.

Metromeet achieved with these two days of Conference, to draw conclusions on the main needs of the sector and discuss about the future of metrology with professionals with different perceptions and different experiences. The international character of Metromeet has once again offered the possibility of crossing borders and establishing a work bond  between the United States and the main European countries that will increase exponentially the innovation and consensus in this field.

The recent incorporation of Innovalia Metrology to the CFAA (Center for Advanced Manufacturing in Aeronautics) allowed the third and final day of Metromeet, not only to expose metrology applications in Automoción as in the last edition of Metromeet, but also in Aeronautics:  “Metrology Trends in Aeronautics”, “Quality Management of Additive Manufacturing Parts for Aeronautics” or “Laser Inspection Systems for Aeronautics”.

Tagged as “Metromeet & Wine” this last day of Metromeet took place in a modern Txakoli winery that offered  the attendees a more relaxed atmosphere while enjoying  6 papers about the most advanced applications of metrology.

With more than 20 speakers and its great international projection, Metromeet turned Bilbao into the capital of Industry 4.0,  making available commercial and networking possibilities, as well as advanced technological solutions that will help the companies of the Basque Country  achieve zero defect manufacturing.

Through Metromeet, Innovalia continues to demonstrate its commitment to technological development and its clear positioning as a prescriber of advanced solutions in the field of quality control and the improvement of manufacturing processes.