Thomas Campbell, best speaker award

Every year the Technical Committee of Metromeet rewards a speaker for an outstanding presentation. This year it was a tough competition because of the high quality of several speakers. Finally the Technical Committee of Metromeet gave the Best Speaker Award to Thomas Campbell (ICTAS, USA), for his presentation "Metrology for Additive Manufacturing Opportunities in a Rapidly Emerging Technology". The Technical Committee remarked the high quality of his presentation and the real applicability.

Two fantastic tutorials in Metromeet

Metromeet will have two exceptional tutorials in charge of Antonio Ventura-Traveset (Datapixel) and  Han Haitjema (Mitutotyo).  
Antonio Ventura-Traveset will talk about the digital metrology workflow as the new paradigm for the knowledge based manufacturing. The tutorial presents an analysis of the new scenario, starting with the requirements of the engineering teams and defining a new paradigm based in the virtualization of the metrological process.  Han Haitjema will will explain how interferometric measurements play a role in nanometrology, including the various techniques employed for obtaining nanometer resolutions and accuracy.

Bernabé Unda will be as special guest at the opening of Metromeet 2012

Metromeet is proud of presenting Bernabé Unda as special guest for the opening of the 8th edition of this unique Conference on Industrial Dimensional Metrology. We want to thank Bernabé Unda, Councilor of Industry, Innovation, Commerce and Tourism of Basque Government, for showing interest in Metromeet.

Nano-metrology; Accuracy of interferometric measurements

Nanometrology will be in the spotlight during Metromeet; besides one track formed by three presentations, Dr. Han Haitjema will give a 2 hours Tutorial in which he will explain how interferometric measurements play a role in nanometrology, including the various techniques employed for obtaining nanometer resolutions and accuracy. Register today for Metromeet and don't miss the latest advances in nanometrology.

Metromeet opened a Twitter account

Follow us on Twitter and be informed fast and acurate about Europe´s finest conference on Industrial Dimensional Metrology.

Keynotes MetroMeet 2012

We are proud to announce the first Keynotes of the 2012 edition; Michael Meador Ph.D - NASA, Thomas Campbell, Ph.D. - (ICTAS), Virginia Tech and Gabriele Jansen - Jansen CEO /EMVA. Besides those renowned Keynotes, there will speakers from Mitutoyo, Imaging Lab, Micro electronics, Bruker, Innovalia Metrology, University of Padova and many more. Please visit the preliminary program to see all speakers of the 8th edition of Metromeet.