METROMEET 2022

09:25-09:30

09:30-10:30

Keynote – Digital Framework for Industrial Metrology driving Decision Intelligence
Toni Ventura | Datapixel (Spain)

10:30-11:00

Vision integrated system for a robot self-calibration solution through 6 DOF uncertainty assessment
Ahmed Chekh /Pablo Puerto | Tekniker e Ideko (Spain)

11:00-11:15

11:15-11:45

How to improve the accuracy of laser-based systems using straight lines
Ivan De Boi | University Antwerp (Belgium)

11:45-12:15

Virtual uncertainty determination and error analysis for CMM laser
Michiel Vlaeyen | KU Leuven (Belgium)

12:15-12:45

5 Axis Machine Tool Metrology for ZDM
Ainhoa Etxabarri – Innovalia Metrology (Spain)

12:45-13:00

Metrolab: Measuring distorted parts with an adaptive measuring template
Gerd Schwaderer – VOLUME GRAPHICS

13:00-14:20

14:20-14:30

14:30-15:00

Deep learning workflows for Improving scan time and image quality in 3D X-ray microscopy
Herminso Villarraga-Gómez – Carl Zeiss Industrial Metrology (USA)

15:00-15:15

Metrolab: Innovalia Metrology

15:15-15:45

Advanced Quality Planning with ISO QIF
Daniel Campbell | Capvidia (USA)

15:45-16:15

Development of an optimised close-range photogrammetry measurement system for coordinate metrology
Joe Eastwood | University of Nottingham (UK)

16:15-16:45

Presenting your results to a non-technical audience
Metrology Tip: Jay Elepano | ZEISS IQS (Germany)