Programa de la Conferencia

Todas las presentaciones contarán con traducción simultanea Inglés – Castellano

 

Descarga el programa de la Conferencia

3

Marzo / Martes

4

Marzo / Miércoles

5

Marzo / Jueves

08:30-09:00

REGISTRO & CAFÉ

09:00-11:30

TUTORIAL

Digital and Virtual Metrology

Toni Ventura | Datapixel (Spain)

11:30-12:15

COFFEE BREAK

12:15-12:35

APERTURA & RUEDA DE PRENSA

12:30-13:30

KEYNOTE 

A general approach to robot path planning for optical inspections

Boris Bogaerts | University of Antwerp (Belgium)

13:30-15:00

COMIDA
 

15:00-15:30

TRACK 1: Industrial Metrology Applications

The Digital Twin – Hands-on Experience from Coordinate Metrology

Daniel Heiselmann | PTB (Germany)

15:30-16:00

 

Improvement hybrid measuring heads with high strength optically transparent measuring tips

Leun Evgeny | Lavochkin association (Russia)

16:00-16:30

Probing in integrated CADCAM for manufacturing automation

Philip Hewitt | Autodesk (United Kingdom)

16:30-17:00

Reliability of Results of Multi-Parameter Measurement Control

Amanzhol Abiyev | Carlsberg (Kazakhstan)

17:00-17:30

Material standards and interference systems for checking and calibrating coordinate measuring machines

Valery Lysenko | VNIIMS (Russia)

17:30-18:00

 
SPECIAL LECTURE: Calibration
Robot systems accuracy

Gorka Kortaberria | Tekniker (Spain)