Programa de la Conferencia
Todas las presentaciones contarán con traducción simultanea Inglés – Castellano
Descarga el programa de la Conferencia
08:30-09:00
REGISTRO & CAFÉ
09:00-11:30
TUTORIAL
Digital and Virtual Metrology
Toni Ventura | Datapixel (Spain)
11:30-12:15
COFFEE BREAK
12:15-12:35
APERTURA & RUEDA DE PRENSA
12:30-13:30
KEYNOTE
A general approach to robot path planning for optical inspections
Boris Bogaerts | University of Antwerp (Belgium)
13:30-15:00
COMIDA
15:00-15:30
TRACK 1: Industrial Metrology Applications
The Digital Twin – Hands-on Experience from Coordinate Metrology
Daniel Heiselmann | PTB (Germany)
15:30-16:00
Improvement hybrid measuring heads with high strength optically transparent measuring tips
Leun Evgeny | Lavochkin association (Russia)
16:00-16:30
Probing in integrated CADCAM for manufacturing automation
Philip Hewitt | Autodesk (United Kingdom)
16:30-17:00
Reliability of Results of Multi-Parameter Measurement Control
Amanzhol Abiyev | Carlsberg (Kazakhstan)
17:00-17:30

Valery Lysenko | VNIIMS (Russia)
17:30-18:00
SPECIAL LECTURE: Calibration

Gorka Kortaberria | Tekniker (Spain)