METROMEET 2022
Metrology 4.0 A Key Enabler Of Industrial Decision Intelligence
April 7th | Thursday
All the presentations of Metromeet will be in English
09:25-09:30
OPENING
09:30-10:30
Keynote - Digital Framework for Industrial Metrology driving Decision Intelligence
Toni Ventura | Datapixel (Spain)
10:30-11:00
Vision integrated system for a robot self-calibration solution through 6 DOF uncertainty assessment
Ahmed Chekh /Pablo Puerto | Tekniker e Ideko (Spain)
11:00-11:15
BREAK
11:15-11:45
How to improve the accuracy of laser-based systems using straight lines
Ivan De Boi | University Antwerp (Belgium)
11:45-12:15
Virtual uncertainty determination and error analysis for CMM laser
Michiel Vlaeyen | KU Leuven (Belgium)
12:45-13:00
Metrolab: Measuring distorted parts with an adaptive measuring template
Gerd Schwaderer - VOLUME GRAPHICS
13:00-14:20
BREAK
14:20-14:30
RECONNECT
14:30-15:00
Deep learning workflows for Improving scan time and image quality in 3D X-ray microscopy
Herminso Villarraga-Gómez - Carl Zeiss Industrial Metrology (USA)
15:00-15:15
Metrolab: Innovalia Metrology
15:45-16:15
Development of an optimised close-range photogrammetry measurement system for coordinate metrology
Joe Eastwood | University of Nottingham (UK)
16:15-16:45
Presenting your results to a non-technical audience
Metrology Tip: Jay Elepano | ZEISS IQS (Germany)
16:45-17:00