Programme

METROMEET 2021 : INTELLIGENT METROLOGY FOR A SUSTAINABLE AND EFFICIENT DIGITAL FACTORY

Download the Conference Programme

 All the presentations of Metromeet will have simultaneous translation English-Spanish

March 25th

Thursday

09:00-09:15

OPENNING

09:15-10:00

New forms of Digital Metrology for the new intelligent Industry

Toni Ventura | Datapixel (Spain)

10:00-10:30

Extending the measurement capabilities of 3D X-ray microscopes to dimensional metrology

Herminso Villarraga-Góme | Zeiss (Spain)

10:30-11:00

Large volume metrology and portable photogrammetry

Pablo Puerto | Ideko & PTB (Germany)

11:00-11:15

BREAK

11:15-11:45

 

Advanced Metrology for machine tool measurement

Ainhoa Etxabarria | Innovalia Metrology (Spain)

11:45-12:15

Development of innovative smart 4.0 tooling set for the manufacturing and assembly of the Advanced Rear ed product

Gorka Kortaberria | Tekniker (Spain)

12:15-12:45

The experience of using material standards and interference systems for checking and calibrating coordinate measuring machines (CMM) of various measurement ranges

Valery Lysenko | VNIIMS (Russia)

15:50-16:00

RECONNECT

16:00-16:45

QIF as an ISO standard for the automated Industry

Jennifer Herron | DMSC (USA)

16:45-17:15

5GROWTH: 5G Metrology for a 5G Industry

Oscar Lazaro | Innovalia Association (Spain)

17:15-17:45

Round table

17:45 – 18:00

 

CLOSING