Programme
METROMEET 2021 : INTELLIGENT METROLOGY FOR A SUSTAINABLE AND EFFICIENT DIGITAL FACTORY
Download the Conference Programme
All the presentations of Metromeet will have simultaneous translation English-Spanish
March 25th
Thursday
09:00-09:15
OPENNING
09:15-10:00
New forms of Digital Metrology for the new intelligent Industry
Toni Ventura | Datapixel (Spain)
10:00-10:30
Extending the measurement capabilities of 3D X-ray microscopes to dimensional metrology
Herminso Villarraga-Góme | Zeiss (Spain)
10:30-11:00
Large volume metrology and portable photogrammetry
Pablo Puerto | Ideko & PTB (Germany)
11:00-11:15
BREAK
11:15-11:45
Advanced Metrology for machine tool measurement
Ainhoa Etxabarria | Innovalia Metrology (Spain)
11:45-12:15
Development of innovative smart 4.0 tooling set for the manufacturing and assembly of the Advanced Rear ed product
Gorka Kortaberria | Tekniker (Spain)
12:15-12:45
The experience of using material standards and interference systems for checking and calibrating coordinate measuring machines (CMM) of various measurement ranges
Valery Lysenko | VNIIMS (Russia)
15:50-16:00
RECONNECT
16:00-16:45
QIF as an ISO standard for the automated Industry
Jennifer Herron | DMSC (USA)
16:45-17:15
5GROWTH: 5G Metrology for a 5G Industry
Oscar Lazaro | Innovalia Association (Spain)
17:15-17:45
Round table
17:45 – 18:00