Programme
All the presentations of Metromeet will have simultaneous translation English-Spanish
Download the Conference Programme
08:30-09:00
REGISTRATION & COFFEE
09:00-11:30
TUTORIAL
Digital and Virtual Metrology
Toni Ventura | Datapixel (Spain)
11:30-12:15
COFFEE BREAK
12:15-12:35
OPENING & PRESS CONFERENCE
12:30-13:30
KEYNOTE
A general approach to robot path planning for optical inspections
Boris Bogaerts | University of Antwerp (Belgium)
13:30-15:00
LUNCH
15:00-15:30
TRACK 1: Industrial Metrology Applications
The Digital Twin – Hands-on Experience from Coordinate Metrology
Daniel Heiselmann | PTB (Germany)
15:30-16:00
Improvement hybrid measuring heads with high strength optically transparent measuring tips
Evgeny Leun | Lavochkin association (Russia)
16:00-16:30
Probing in integrated CADCAM for manufacturing automation
Philip Hewitt | Autodesk (United Kingdom)
16:30-17:00
SPECIAL LECTURE: Calibration
Robot systems accuracy
Gorka Kortaberria | Tekniker (Spain)
20:30 – 23:00