Aravind Govindan, industry analyst at Frost & Sullivan will be the responsible of the opening keynote during the first day of Metromeet. He holds a bachelors degree in commerce from the University of Madras and Masters in International Business from the University of Sydney. With more than 5 years of experience in market research and […]
We are proud of announcing the participation of Renishaw as one of the Premium Sponsors of the Conference. Renishaw will have a 9 square meters booth in the Exhibition Hall of Metromeet; a space to present their latest develops in the metrologic sector. Are you interested in visit our Exhibition Hall? Register today! We still […]
For this year´s Metromeet we have decided to add a special day dedicated to the automotive world. On the morning of Friday, February 26 and set in a special location, we will organize an informal gathering with the purpose to better understand the needs of the manufacturing industry.
Metromeet has already confirmed the dates for the 12th edition, to be held in Bilbao on 24, 25 and 26 February 2016. The Technical Committee of Metromeet has decided to extend the duration of the Conference, to include new topics, something very important in a sector which changes everyday, like the industrial dimensional metrology is.
Come to Metromeet with your complete team and you will enjoy our special group discount. The bigger your team is, the bigger the discount you will benefit.*protected email* and you will get a taylor-made offer.
True three dimensional (3D) measurements of micro and nano structures are becoming crucial tasks following the continuous miniaturization in mechanical and optical production. To realize an ultra high precision micro/nano-coordinate measuring machine (CMM), the development of tactile probes is a vital task.
Automotive, medical and telecommunications industries, to name but a few, are increasing their reliance on microparts with complex geometries. An important development in the area of industrial dimensional metrology is “multi-sensor co-ordinate metrology”.