Programme
All the presentations of Metromeet will have simultaneous translation English-Spanish
08:30-09:00
REGISTRATION
Measuring in machine tool11:30-12:15
COFFEE BREAK
12:15-12:45
12:45-13:15
TRACK 3: Advanced Calibration
Equipment calibration, qualification and validation, the customer´s role
Jan Lasson Andreasen | Novo Nordisk – Denmark
Extrinsic calibration and kinematic modelling of a laser line triangulations sensor integrated in an intelligent fixture with 3 degrees of freedom
Ahmed Chekh | Tekniker – Spain
13:15-15:00
LUNCH
TRACK 4: Metrology 4.0
15:00-15:30
Computer Aided Technologies for Additive Manufacturing – CAxMan
Jean-Claude Morel | Topsolid – France
15:30-16:00
Integrated Information for Improved Quality Demonstrators
Toby Maw | the MTC – United Kingdom
16:00-16:30
SPECIAL LECTURE
TRACK 5: Industrial Metrology Solutions
16:30-17:00
Digital thread through International standards
Alain Pfouga | Prostep ivip Association – Germany
Nanoanalysis for the semiconductor industry17:30-18:00
Hybrid active control devices with transparent and high-strength tips for contact and non-contact measurement
Evgeny Leun | Lavochkin Association – Russia
18:00-18:30
Metrology for additive manufactured components for advanced industrial applications
Andrew Townsend | EPSRC Future Metrology Hub – United Kingdom
MANUFACTURING STANDARDS ROUND TABLE + CLOSING