Programme

All the presentations of Metromeet will have simultaneous translation English-Spanish

Download the Conference Programme

10

April / Wednesday

11

April / Thursday

12

April / Friday

08:30-09:00

REGISTRATION

09:00-11:30

TUTORIAL

Measuring in machine tool

Ainhoa Etxabarri | Unimetrik 

Spain

11:30-12:15

COFFEE BREAK

12:15-12:45

12:45-13:15

TRACK 3: Advanced Calibration
Equipment calibration, qualification and validation, the customer´s role

Lorenzo Carli | Novo Nordisk – Denmark

Calibration technology for tomography

Jon Martin & Naiara Ortega | Innovalia & UPV/EHU- CFAA – Spain

13:15-15:00

LUNCH

15:00-15:30

TRACK 4: Metrology 4.0

Adalam: Developping an adaptive laser micromachining system

Silvia de la Maza | Innovalia – Spain

15:30-16:00

Computer Aided Technologies for Additive Manufacturing – CAxMan

Jean-Claude Morel  | Topsolid – France

16:00-16:30

Integrated Information for Improved Quality Demonstrators

Toby Maw | the MTC – United Kingdom

16:30-17:00

SPECIAL LECTURE

The design and fabrication of the Multi Link Inspection tool

Gabriele D’amico | F4E

Italy

TRACK 5: Industrial Metrology Solutions

17:00-17:30

Hybrid active control devices with transparent and high-strength tips for contact and non-contact measurement

Evgeny Leun | Lavochkin Association – Russia

17:30-18:00

Nanoanalysis for the semiconductor industry

Narciso Gambacorti | CEA – France

18:00-18:30

Metrology for additive manufactured components for advanced industrial applications

Paul Bills | EPSRC Future Metrology Hub – United Kingdom

18:30-19:00

Towards superresolution surface metrology

Samanta Piano | Nottingam University – United Kingdom

19:00-19:30

ROUND TABLE + CLOSING