Programme

All the presentations of Metromeet will have simultaneous translation English-Spanish

Download the Conference Programme

10

April / Wednesday

11

April / Thursday

12

April / Friday

08:30-09:00

REGISTRATION

09:00-11:30

TUTORIAL

Measuring in machine tool

Ainhoa Etxabarri | Unimetrik 

Spain

11:30-12:15

COFFEE BREAK
 

12:15-12:45

12:45-13:15

TRACK 3: Advanced Calibration
Equipment calibration, qualification and validation, the customer´s role

Jan Lasson Andreasen | Novo Nordisk – Denmark

Extrinsic calibration and kinematic modelling of a laser line triangulations sensor integrated in an intelligent fixture with 3 degrees of freedom

Ahmed Chekh | Tekniker – Spain

13:15-15:00

LUNCH
 
TRACK 4: Metrology 4.0

15:00-15:30

 

Computer Aided Technologies for Additive Manufacturing – CAxMan

Jean-Claude Morel  | Topsolid – France

15:30-16:00

Integrated Information for Improved Quality Demonstrators

Toby Maw | the MTC – United Kingdom

16:00-16:30

 
SPECIAL LECTURE

The design and fabrication of the Multi Link Inspection tool

Gabriele D’amico | F4E

Italy

 
 
TRACK 5: Industrial Metrology Solutions

16:30-17:00

Hybrid active control devices with transparent and high-strength tips for contact and non-contact measurement

Evgeny Leun | Lavochkin Association – Russia

17:00-17:30

Nanoanalysis for the semiconductor industry

Narciso Gambacorti | CEA – France

17:30-18:00

Metrology for additive manufactured components for advanced industrial applications

Paul Bills | EPSRC Future Metrology Hub – United Kingdom

18:00-18:30

ROUND TABLE + CLOSING