METROMEET 2023
Digital Metrology Shaping the Future of Industrial Manufacturing
19 + 20 April 2023
Bilbao / SPAIN
All the presentations of Metromeet will be in English
19
April / Wednesday
20
April / Thursday
APRIL 20th
![_registration](https://metromeet.org/wp-content/uploads/2023/02/registration.png)
08:30 – 09:00
Registration
SPECIAL SESSION
09:00 – 09:40
When Metrologists start to talk with Simulation
Gerd Schwaderer | Volume Graphics GmbH, part of Hexagon, Germany
TRACK 4 · Metrology and Machine Tool: Advances in Machine Tool Verification and Machining Optimization
09:40 – 10:20
Virtual Metrology for Machining Applications
Dimitris Kyritsis | Professor of ICT for Sustainable Manufacturing, Switzerland
10:20 – 11:00
Verification of machining centers with metrological sw and artifacts
Ainhoa Etxabarri | Innovalia Metrology, Spain
11:00 – 11:40
Digital Twin applications for virtual metrology in milling manufacturing processes
Dimitris Kyritsis | Professor of ICT for Sustainable Manufacturing, Switzerland
![coffee](https://metromeet.org/wp-content/uploads/2023/02/coffee.png)
11:40 – 12:10
Coffee Break
TRACK 5 · Metrology and Additive Manufacturing: CT Scanning and Quality Assessment
![](https://metromeet.org/wp-content/uploads/2023/02/Ibon_Holgado.jpg)
12:10 – 12:50
Quality assessment of the internal structure of additively manufactured aluminum parts by
means of industrial computed tomography scanning
Ibon Holgado | (CFAA)-UPV/EHU, Spain
12:50 – 13:30
Metrological evaluation of 3D printed Poly(Lactic Acid) fixtures by Fused Deposition Modeling (FDM)
Pablo Antunes da Rosa | Boticario Group, Brazil
![cutlery](https://metromeet.org/wp-content/uploads/2023/02/cutlery.png)
13:30 – 15:00
Lunch · Jauregia Restauran
TRACK 6 · Techniques and Applications for Metrology Innovation
![](https://metromeet.org/wp-content/uploads/2023/03/Andrea_Pellegrino.jpg)
15:00 – 15:40
The importance of metrology support in big structure assembly
Andrea Pellegrino | GEATOP srl, Italy
![](https://metromeet.org/wp-content/uploads/2023/02/Serafeim_Moustakidis-1-e1677514685728.jpg)
![](https://metromeet.org/wp-content/uploads/2023/03/Eleni_Lavasa.jpg)
15:40 – 16:20
Predicting Point-Wise Measurement Accuracy of Scanning Devices using XAI-based Approaches: Towards Metrology 4.0
Serafeim Moustakidis & Eleni Lavasa | CTO / AIDEAS OU, Estonia & Athena RC, Greece
16:20 – 17:00
Object pose estimation for stereo imaging using raycasting
Joe Eastwood | University of Nottingham, UK
17:00 – 17:40
Uncertainty in position measured with MEMS-type. Inertial Measurement Units
James Schipmann Eger | Federal University of Santa Catarina, Brazil